Development of an Automated System for Measuring the Characteristics of Discrete Semiconductor Devices

During the implementation of the graduation work, a LabView-based hardware-software module for low-power semiconductor thyristor curves measurement was developed. The module is included into an automated system for semiconductor devices characteristics measurement. The theoretical information about thyristors was carefully studied and the existing means of thyristor characteristics measurement were analyzed. The program code of the existing system was upgraded, the possibility of thyristor output volt-ampere characteristics measurement was added. Within IC CAP software a system for automatic determination of thyristor parameters was developed. The experimental measurements of the thyristor model KU101A3 were carried out, its characteristics and parameters were calculated, a SPICE model of the thyristor was developed. The work contains 50 pages, 27 drawings, 24 sources, 2 appendices.