Vladimir Krutikov
- Department Head, Professor:HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE) / Joint Department with the All-Russian Research Institute for Optical and Physical Measurements
- Vladimir Krutikov has been at HSE since 2013.
Education, Degrees and Academic Titles
- 2005
Doctor of Sciences*
- 1999Associate Professor
- 1976
Candidate of Sciences* (PhD)
- 1970
Degree in Radiophysics and Electronics
Moscow Institute of Physics and Technology
* Candidate of Sciences
According to the International Standard Classification of Education (ISCED) 2011, Candidate of Sciences belongs to ISCED level 8 - "doctoral or equivalent", together with PhD, DPhil, D.Lit, D.Sc, LL.D, Doctorate or similar. Candidate of Sciences allows its holders to reach the level of the Associate Professor.
According to the International Standard Classification of Education (ISCED) 2011, Candidate of Sciences belongs to ISCED level 8 - "doctoral or equivalent", together with PhD, DPhil, D.Lit, D.Sc, LL.D, Doctorate or similar. Candidate of Sciences allows its holders to reach the level of the Associate Professor.
* Doctor of Sciences
A post-doctoral degree called Doctor of Sciences is given to reflect second advanced research qualifications or higher doctorates in ISCED 2011.
A post-doctoral degree called Doctor of Sciences is given to reflect second advanced research qualifications or higher doctorates in ISCED 2011.
Student Term / Thesis Papers
- Master
I. Martynenko «Develop a Technology for the Production of Multi-Alkali Photocathode for Time-Analyzing of an Electron-Optical Converter». HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE), 2017
R. Shamilev «The Development of High-Voltage field Subnanosecond Field-Forming System Based on TEM-cell with Splitted Potential Electrode». HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE), 2016
A. Aleksandrov «The Development and Characterization of Secondary Standard of Pulse Electric and Magnetic Fields Strengths Units with Pulse Rise Time up to 20 ps». HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE), 2016
M. Solodilova «Investigation of the Metrological Characteristics of the State Spectrophotometry Standard to Expand its Calibration and Functionality». HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE), 2016
Courses (2018/2019)
- Electronic Engineering Research Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); programme "Electronic Engineering"; 2 year, 1, 2 module)Rus
- Research and Design Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); programme "Electronic Engineering"; 1 year, 1-4 module)Rus
- Past Courses
Courses (2017/2018)
- Electronic Engineering Research Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); programme "Electronic Engineering"; 1 year, 1-4 module)Rus
- Electronic Engineering Research Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); programme "Electronic Engineering"; 2 year, 1, 2 module)Rus
Courses (2016/2017)
- Electronic Engineering Research Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 1 year, 1-4 module)Rus
- Electronic Engineering Research Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 2 year, 1, 2 module)Rus
Courses (2015/2016)
- Electronic Engineering Research Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 1 year, 1-4 module)Rus
- Measuring Technologies of Nanoindustry Research Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 2 year, 1, 2 module)Rus
Courses (2014/2015)
Interdisciplinary Term Paper (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 1 year, 2-4 module)Rus
- Measuring Technologies of Nanoindustry (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 2 year, 1, 2 module)Rus
- Measuring Technologies of Nanoindustry Research Seminar (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 1 year, 1-4 module)Rus
- Metrological Assurance of Nanotechnology (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 2 year, 1, 2 module)Rus
Science and Research Internship (Master’s programme; HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE); 1 year, 3 module)Rus
Courses (2013/2014)
Interdisciplinary Term Paper (Master’s programme; Faculty of Electronics and Telecommunications; 1 year, 2-4 module)Rus
Publications14
- Article Крутиков В. Н., Хатырев Н., Щербина А. Метод измерения временных интервалов корреляционных функций последовательности фемтосекундных лазерных импульсов // Измерительная техника. 2017. № 2. С. 32-35.
- Article Крутиков В. Н. Метрологическое обеспечение качества продукции. часть 2. состояние метрологического обеспечения в здравоохранении // Контроль качества продукции. 2017. № 6. С. 23-28.
- Article Магницкий С., Фроловцев Д., Агапов Д., Демин А., Крутиков В. Н. Метрология одиночных фотонов для квантовых информационных технологий // Измерительная техника. 2017. № 3. С. 24-29.
- Article Golubev S., Krutikov V.N., Ivanov V., Zolotarevsky Yu.M. Improvement of the standards base for optophysical measurements // Измерительная техника. 2016. Т. 58. № 11. С. 1189-1194.
- Article Zolotarevsky Yu.M., Korolev I., Krutikov V.N. Metrological support of measurements of the frequency of radiation in optical data processing systems // Измерительная техника. 2016. Т. 58. № 11. С. 1205-1209.
- Article Anevskii S., Zolotarevsky Yu.M., Ivanov V., Krutikov V.N. Spectroradiometry of ultraviolet radiation // Измерительная техника. 2016. Т. 58. № 11. С. 1216-1222.
- Article Крутиков В. Н. Метрологическое обеспечение качества продукции. Часть 1. Основные проблемы // Контроль качества продукции. 2016. № 9. С. 5-11.
- Chapter Tikhonov А. N., Lvov B. G., Petrosyants K. O., Uvaysov S. U., Kharitonov I. A., Balakin Staniclav, Chetyrkin A., Krutikov V.N. The System of Microelectronics Education for Aerospace Industry Based on “University-Enterprise” Link, in: Proceedings of the Tenth Workshop on Microelectronics Education (EWME 2014 ) Vol. 1. Tallinn : Tallinn University of Technology, 2014. Ch. S04-02. P. S04-02-0027-S04-02-0035.
- Article Крутиков В. Н., Золотаревский Ю. М., Лясковский В. Л. Высокодобротные оптические микрорезонаторы с модами типа шепчущей галереи и их применение в прецизионных измерениях // Метрология. Ежемесячное приложение к научно-техническому журналу «Измерительная техника». 2014. № 12. С. 22-40.
- Article Окрепилов В., Крутиков В. Н. Экономическая составляющая в обеспечении единства измерений // Измерительная техника. 2014. № 2. С. 3-8.
- Article Новиков Ю., Летуновский М., Булыгин Ф. В., Крутиков В. Н. IV Всероссийская научно-практическая конференция “Нормативно-правовое регулирование в области обеспечения единства измерений” // Мир измерений. 2013. № 5. С. 47-50.
- Article Золотаревский Ю. М., Крутиков В. Н. Optimization of the parameters of a standard source of synchrotron radiation with strong magnetic field for calibration of ultraviolet plasma radiators and integral radiometer-dosimeters // Измерительная техника. 2013. Т. 55. № 12. С. 1356-1363.
- Article Кононогов С. А., Золотаревский С., Булыгин Ф. В., Крутиков В. Н. Ареальные методы анализа топографии и текстуры поверхности в микронанометровом диапазонах // Метрология. Ежемесячное приложение к научно-техническому журналу «Измерительная техника». 2013. № 2. С. 13-24.
- Article Булыгин Ф. В., Крутиков В. Н. Эталонные источники малоуровневого оптического излучения на основе нанотехнологий // Измерительная техника. 2013. № 1. С. 30-33.
