Boris Glebovich Lvov

Head, Professor:HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE) / School of Electronic Engineering

Boris Glebovich Lvov has been at HSE University since 2012.

Education, Degrees and Academic Titles

2002
Professor
2001
Doctor of Sciences* in Technology and Equipment for Manufacture of Semiconductors, Materials and Devices of Electronic Technics
Moscow Institute of Electronics and Mathematics
1985
Associate Professor
1980
Candidate of Sciences* (PhD) in Technology and Equipment for Manufacture of Semiconductors, Materials and Devices of Electronic Technics
Moscow Institute of Electronic Engineering
1969
Degree
Moscow Institute of Electronic Engineering

* Candidate of Sciences
According to the International Standard Classification of Education (ISCED) 2011, Candidate of Sciences belongs to ISCED level 8 - "doctoral or equivalent", together with PhD, DPhil, D.Lit, D.Sc, LL.D, Doctorate or similar. Candidate of Sciences allows its holders to reach the level of the Associate Professor.

* Doctor of Sciences
A post-doctoral degree called Doctor of Sciences is given to reflect second advanced research qualifications or higher doctorates in ISCED 2011.

Professional Interests

Quality and Effectiveness of Scientific Activity

Higher Vocational Education. Pedagogy in Higher Vocational School

Technology and Equipment for Electronic and Radio Production

Design and Construction of Technical Systems

Vacuum Science and Technology

Awards and Accomplishments

Honored Worker of Higher Education of the Russian Federation (2005)
Winner of the Russian Federation President’s Prize in Education (2003)
Medal ‘In Commemoration of the 850th Anniversary of Moscow’ (1997)
Winner of the USSR State Prize in Science and Technology (1984)

Surcharge for academic work (2014-2015)

Editorial board membership

2011: Member of the Editorial Council, Наноинженерия.

Conferences

2018
The IEEE International Conference "Quality Management, Transport and Information Security, Information Technologies" (IT&QM&IS-2018). (Санкт-Петербург). Presentation: Reliability of Space Infocommunications Equipment
The IEEE Moscow Workshop on Electronic and Networking Technologies (MWENT-2018). (Москва). Presentation: Automation of Parameter Extraction Procedure for Si JFET SPICE Model in the −200…+110°C Temperature Range
2016
Международная IEEE-сибирская конференция по управлению и связи (SIBCON–2016) (Москва). Presentation: Welcome message from the technical program committee chairs
2014
10th European Workshop on Microelectronics Education (Таллин). Presentation: The System of Microelectronics Education for Aerospace Industry Based on “University-Enterprise
3rd International Scientific – Practical Conference: Innovative Information Technologies (Прага). Presentation: The laboratory stand for diagnosing of radio-electronic equipment on the example of the common emitter amplifier, in: Innovative Information Technologies
1-й Всероссийский форум технологического лидерства России "ТЕХНОДОКТРИНА-2014" (Москва). Presentation: Система целевой подготовки специалистов в области электроники для аэрокосмической отрасли, построенная на базе научно-образовательных модулей «вуз-предприятие»
XI Международная научно-практическая конференция «ИННОВАЦИИ НА ОСНОВЕ ИНФОРМАЦИОННЫХ И КОММУНИКАЦИОННЫХ ТЕХНОЛОГИЙ» (ИНФО-2014) (Сочи). Presentation: Особенности проектирования современных конструкций приборов радиоэлектронной аппаратуры
2013
Международная научно-практическая конференция "Инновационные информационные технологии (I2T)" (Прага). Presentation: Задачи разработки информационного обеспечения продвижения результатов НИОКР в инновационном цикле
X Международная научно-практическая конференция "Инновации на основе информационных и коммуникационных технологий" (ИНФО-2013) (Сочи). Presentation: Классификация объектов, алгоритмов и средств контроля и диагностики электронных узлов аппаратуры обработки радиопеленгационной информации
2012
«Менеджмент качества и менеджмент информационных систем» (MQ&ISM-2012) (Вена). Presentation: Применение метода анализа иерархий для оценки эффективности изобретений в составе сложной технической системы
«Менеджмент качества и менеджмент информационных систем» (MQ&ISM-2012) (Вена). Presentation: Применение метода анализа иерархий для оценки эффективности изобретений в составе сложной технической системы
международная научно-практическая интернет-конференция SWorld: «Перспективные инновации в науке, образовании, производстве и транспорте ‘2012. Presentation: Способ определения остаточных внутренних напряжений в монокристаллических материалах
«Менеджмент качества и менеджмент информационных систем» (MQ&ISM-2012) (Вена). Presentation: Применение метода анализа иерархий для оценки эффективности изобретений в составе сложной технической системы

Publications¹⁸

Article Karabassov T., Valeriia D. Pashkovskaia, Nikita A. Parkhomenko, Anastasia V. Guravova, Kazakova E. A., Boris G. Lvov, Alexander A. Golubov, Andrey S. Vasenko. Density of states in the presence of spin-dependent scattering in SF bilayers: a numerical and analytical approach // Beilstein Journal of Nanotechnology. 2022. Vol. 13. P. 1418-1431. doi
Article T. Karabassov, A.V. Guravova, A.Yu. Kuzin, Kazakova E. A., Kawabata S., B.G. Lvov, A.S. Vasenko. Anomalous current–voltage characteristics of SFIFS Josephson junctions with weak ferromagnetic interlayers // Beilstein Journal of Nanotechnology. 2020. Vol. 11. P. 252-262. doi
Article Córdoba C. W., da Silva R. M., Shanenko A., Vagov A., Vasenko A., Lvov B. G., Albino Aguiar J. Spontaneous pattern formation in superconducting films // Journal of Physics: Condensed Matter. 2020. Vol. 32. No. 075403. Article 075403. doi
Article Karabassov T., Stolyarov V. S., Golubov A. A., Silkin V. M., Bayazitov V. M., Lvov B. G., Vasenko A. S. Competitive 0 and π states in S/F/S trilayers: Multimode approach // Physical Review B: Condensed Matter and Materials Physics. 2019. Vol. 100. No. 10. P. 104502-1-104502-9. doi
Article Petrosyants K. O., Kharitonov I. A., Pugachev A., Lvov B. G. I-V- Characteristics Analysis of Betavoltaic Microbatteries Using TCAD Model // Journal of Physics: Conference Series. 2019. Vol. 1353. No. 1. P. 1-7. doi
Chapter Petrosyants K. O., Ismail-zade M. R., Sambursky L. M., Dvornikov O. V., Lvov B. G., Kharitonov I. A. Automation of Parameter Extraction Procedure for Si JFET SPICE Model in the −200…+110°C Temperature Range, in: 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT). Proceedings. M. : IEEE, 2018. P. 1-5. doi
Chapter Petrosyants K. O., Nikita I. Ryabov, Boris G. Lvov, Ekaterina I. Batarueva Б. Е. Development of Compact SPICE-models of IC Resistive Interconnects with Different Configurations, in: 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT). Proceedings. M. : IEEE, 2018. Ch. 10. P. 1-4. doi
Article Lehtinen J. S., Lvov B. G., Arutyunov K. Quantum charge dynamics in quasi-one-dimensional superconductors / Пер. с рус. // Physics of the Solid State. 2018. Vol. 60. No. 11. P. 2135-2138. doi
Chapter Kofanov Y. N., Lvov B. G., Meleh N. A., Sotnikova S. Reliability of Space Infocommunications Equipment, in: Proceedings of the 2018 IEEE International Conference "Quality Management, Transport and Information Security, Information Technologies" (IT&QM&IS). IEEE, 2018. P. 354-357. doi
Article Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov. Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI’s Using Universal Rad-SPICE MOSFET Model // Journal of Electronic Testing: Theory and Applications (JETTA). 2017. Vol. 33. No. 1. P. 37-51. doi
Chapter Petrosyants K. O., Sambursky L. M., Kharitonov I. A., Lvov B. G. Fault Simulation in Radiation-Hardened SOI CMOS VLSIs using Universal Compact MOSFET Model, in: Proceedings of the IEEE Latin-American Test Symposium (LATS-2016). NY : The Institute of Electrical and Electronics Engineering, Inc., 2016. P. 117-122. doi
Chapter Petrosyants K. O., Kharitonov I. A., Nikita I. Ryabov, Kozynko P. A., Boris G. Lvov. Hardware-Software Subsystem for Multilevel Thermal Fault Detection and Analysis of Electronic Components, in: 2016 International Siberian Conference on Control and Communications (SIBCON). Proceedings. M. : HSE, 2016. P. 1-6. doi
Chapter Stukach O., Lvov B. G. Welcome message from the technical program committee chairs, in: 2016 International Siberian Conference on Control and Communications (SIBCON). Proceedings. M. : HSE, 2016. Ch. 1. P. 1-1. doi
Chapter Veselov E. A., Uvaysov S. U., Lvov B. G., Furman Y., Vetrov V. A. Direct and reverse projection procedures in problems of 3D objects reconstruction from images, in: Innovative Information Technologies: Materials of the International scientific–practical conference. Part 2 / Ed. by S. U. Uvaysov. Part 2. M. : HSE, 2014. Ch. 2. P. 710-716.
Chapter Uvaysova S., Uvaysova A., Lvov B. G., Zhurkov A.P. Ensure maintainability direction finder positions, in: Innovative Information Technologies: Materials of the International scientific-practical conference. Part 3 / Ed. by S. U. Uvaysov. Part 3. M. : HSE, 2014. Ch. 3. P. 164-166.
Chapter Tikhonov А. N., Lvov B. G., Petrosyants K. O., Uvaysov S. U., Kharitonov I. A., Balakin Staniclav, Chetyrkin A., Krutikov V.N. The System of Microelectronics Education for Aerospace Industry Based on “University-Enterprise” Link, in: Proceedings of the Tenth Workshop on Microelectronics Education (EWME 2014 ) Vol. 1. Tallinn : Tallinn University of Technology, 2014. Ch. S04-02. P. S04-02-0027-S04-02-0035.
Chapter Ivanov I., Uvaysov S. U., Lvov B. G., Korolev P. The laboratory stajnd for diagnosing of radio-electronic equipment on the example of the common emitter amplifier, in: Innovative Information Technologies: Materials of the International scientific-practical conference. Part 3 / Ed. by S. U. Uvaysov. Part 3. M. : HSE, 2014. Ch. 3. P. 311-313.
Article Belsky M. D., Lvov B. G., Rybalko V. V. Modeling the focusing microlenses of an Auger analyzer equipped with a CMA / Пер. с рус. // Bulletin of the Russian Academy of Sciences: Physics. 2013. Vol. 77. No. 8. P. 959-962.

Research Projects

‘Development and testing of a virtual device simulating real measuring equipment for nanotechnologies ’ (2012-2013) – Head

‘Development of methods formulti-levelresearch and simulation of advancedmicroelectronic Components frommaterial to circuit withhigher resistanceto thermaland radiationeffects’ (2013)

Methodological &Editorial Activities

•Member of theCouncil for Education in radio engineering, electronics, biomedical engineering and automation

• Member of theEditorial Boardof journals

-‘Nanoengineering’

- ‘ Quality.Innovation.Education’

Dissertations

Scientific adviserofdissertationresearch

-for the degree ofcandidateof technical sciences

•NicholayevskyA. V. Experimental study ofa non-contact surface nanostructuresformation by scanning tunnelingmicroscopy. 2012

Patents

- RF patentsfor utility models(with students):

Devicefor nanodisplacement № 124859 from 10.02.2013

Nanotechnology d evice to forming quantum dotson a substrate № 118120 from 10.07.2012

Device fornanotechnologyoperations- №115123from20.04.2012

Device forcarbon structuresassembling- №115124from20.04.2012

Displacement devicefornanotechnology № 114570 from 27.03. 2012

Timetable for today

Show timetable archive

Full timetable

Oct

2014

Faculties Still Expanding at HSE

As part of organizational reform at HSE, two more ‘big’ faculties are being created – the Faculty of Economic Sciences and the Faculty of Humanities. These faculties will include educational and research divisions in their corresponding fields. Changes will also take place in the structure of HSE’s Moscow State Institute of Electronics and Mathematics.