Developing of Estimating Durability Measures' Prior Models for Foreign Eectronic Components

Master's work is about developing evaluation method for useful life of foreign and domestic electronic components. There isn’t term “useful life” at foreign reliability documents and that’s the difference between domestic and foreign methods. MTTF (mean time to failure) is used instead of useful life and it isn't the same. MTTF is close to domestic term “mean operating time to failure”. There are some methods for evaluation useful life at domestic documents and handbooks. These methods help to unite mathematic models of “useful life” and “mean operating time to failure. Hypothesis is based on idea of using domestic methods for foreign electronic components, but it has some troubles. MTTF evaluation is based on statistic of reliability tests. Objective of this work is developing method for evaluation useful life for foreign electronic components and uniting this method with domestic methods. New method is mainly based on analysis of reliability reports. Useful life’s value may be used as data for domestic methods, but there are some difficulties, that well described further. This method is required by some firms produced spacecraft devices and they are waiting results.