Thermoelectric Transport in Josephson Junctions for Eelectronic Applications

Student: Osipova Anna

Faculty: HSE Tikhonov Moscow Institute of Electronics and Mathematics (MIEM HSE)

Educational Programme: Infocommunication Technologies and Systems (Bachelor)

Year of Graduation: 2019

The present investigation will largely be confined to decisions of Joule losses problem in one of the types of Josephson junctions, which is Superconductor-Insulator-Graphene-Insulator-Superconductor contact (S-I-G-I-S). The goal of this study will be the suppression of the excess current in Josephson junctions with a graphene interlayer at a high bias by the Joule heating. If the bias is high, a normal hot spot is formed around the junction, and its size grows with the bias. Since the excess current reduces to zero, as soon as a hot spot is formed, one sees a dip in differential conductance dI/dV

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